Ex Parte YanagiDownload PDFPatent Trial and Appeal BoardDec 27, 201612816465 (P.T.A.B. Dec. 27, 2016) Copy Citation United States Patent and Trademark Office UNITED STATES DEPARTMENT OF COMMERCE United States Patent and Trademark Office Address: COMMISSIONER FOR PATENTS P.O.Box 1450 Alexandria, Virginia 22313-1450 www.uspto.gov APPLICATION NO. FILING DATE FIRST NAMED INVENTOR ATTORNEY DOCKET NO. CONFIRMATION NO. 12/816,465 06/16/2010 Yuji YANAGI 20100817A 3415 513 7590 12/29/2016 WENDEROTH, LIND & PONACK, L.L.P. 1030 15th Street, N.W., Suite 400 East EXAMINER CHEN, KEATH T Washington, DC 20005-1503 ART UNIT PAPER NUMBER 1716 NOTIFICATION DATE DELIVERY MODE 12/29/2016 ELECTRONIC Please find below and/or attached an Office communication concerning this application or proceeding. The time period for reply, if any, is set in the attached communication. Notice of the Office communication was sent electronically on above-indicated "Notification Date" to the following e-mail address(es): ddalecki@wenderoth.com eoa@ wenderoth. com PTOL-90A (Rev. 04/07) UNITED STATES PATENT AND TRADEMARK OFFICE BEFORE THE PATENT TRIAL AND APPEAL BOARD Ex parte YUJI YANAGI Appeal 2015-005103 Application 12/816,465 Technology Center 1700 Before PETER F. KRATZ, MICHAEL P. COLAIANNI, and AVELYN M. ROSS, Administrative Patent Judges. COLAIANNI, Administrative Patent Judge. DECISION ON APPEAL Appeal 2015-005103 Application 12/816,465 Appellant appeals under 35 U.S.C. § 134(a) the final rejection of claims 1—10. We have jurisdiction over the appeal pursuant to 35 U.S.C. § 6(b). We REVERSE. Appellant’s invention is directed “to a vacuum vapor deposition apparatus which forms a thin film by depositing multiple vaporization materials simultaneously on a deposition target” (Spec. 11). The goal of the vacuum vapor deposition apparatus is to provide a uniform film thickness distribution of a thin film deposited on a large substrate (Spec. 1 8). Claim 1 is illustrative: 1. A vacuum vapor deposition apparatus comprising: a vaporization container that has a plurality of release holes arranged linearly in an arrangement direction in only one line such that a conductance by the release holes on both end portion sides of the vaporization container is larger than at the center of the vaporization container, wherein the vaporization container is one container containing a vaporization material on one bottom thereof for the plurality of release holes and the vaporization container is configured to be heated so as to evaporate or sublimate the vaporization material such that vapor of the vaporization material is released through the plurality of release holes, and wherein the vaporization material is to be deposited on an entire surface of a substrate by relatively moving the substrate and the vaporization container in a direction perpendicular to the arrangement direction of the plurality of release holes; and a current plate fixed in the vaporization container so as to directly face the vaporization material, the current plate having a plurality of passage holes through which the vapor passes, the passage holes being arranged on both sides of the line of the release holes when viewed from the top of the vaporization container, and as conductance per unit length in the arrangement direction of the plurality of release holes, conductance by the passage holes is made proportional to conductance by the release holes along the arrangement direction, wherein both the conductance by the release holes and the conductance by the passage holes are increasingly larger from the center of the vaporization container to each end portion side of the vaporization container. 2 Appeal 2015-005103 Application 12/816,465 (emphasis added to highlight argued limitations) Appellant appeals the following rejections: 1. Claims 1—7, 9, and 10 are rejected under 35 U.S.C. § 103(a) as unpatentable over Otsuka et al. (US 2007/0134405 Al, published June 14, 2007) (“Otsuka”) in view of Ahn et al. (KR 2009-0047953 A, published May 13, 2009) (“Ahn”) and Van Slyke et al. (US 2003/0015140 Al, published Jan. 23, 2003) (“Van Slyke”). 2. Claims 7 and 8 are rejected under 35 U.S.C. § 103(a) as unpatentable over Otsuka in view of Ahn, Van Slyke, and Iwasaki et al. (US 2007/0204798 Al, published Sept. 6, 2007) (“Iwasaki”). 3. Claims 5 and 10 are rejected under 35 U.S.C. § 103(a) as unpatentable over Otsuka in view of Ahn, Van Slyke, and Negishi (US 2009/0061090 Al, published Mar. 5, 2009). FINDINGS OF FACT & ANALYSIS The Examiner’s findings and conclusions regarding claim 1 are located on pages 2 to 4 of the Answer. The Examiner finds, in relevant part, that Otsuka as modified by Van Slyke1 teaches the subject matter of claim 1, except for the conductance per unit length in the arrangement direction of the plurality of release holes, conductance by the passage holes is made proportional to conductance by the release holes along the arrangement direction, wherein both conductance by the release 1 Appellant does not contest the Examiner’s findings or conclusions regarding the combination of Otsuka and Van Slyke (App. Br. 3—11). 3 Appeal 2015-005103 Application 12/816,465 holes and the conductance by the passage holes are increasingly larger from the center of the vaporization container to each end portion side of the vaporization container (Ans. 2—3). The Examiner finds that Anh’s Figure 4 shows more slits and larger slits 251 in the fluid path partition wall 250 (corresponding to current plate 14) in addition to denser spacing of nozzles 160 at both ends of the front of the container for the purpose of even deposition in the substrate (Ans. 3). Based on Figure 4, the Examiner finds that conductance by the passage holes is made proportional to the conductance by the release holes (Ans. 3). Appellant argues that Ahn’s Figure 4 does not reasonably teach or suggest that as conductance per unit length in the arrangement direction of the plurality of release holes, conductance by the passage holes is made proportional to conductance by the release holes along the arrangement direction, and both the conductance by the release holes and the conductance by the passage holes are increasingly larger from the center of the vaporization container to each end portion side of the vaporization container, as required by claim 1. (App. Br. 5). Appellant contends that the Examiner has not established that Ahn’s Figure 4 teaches the conductance per unit length limitation (App. Br. 4). Claim 1 recites that as conductance per unit length in the arrangement direction of the plurality of release holes, conductance by the passage holes [18] is made proportional to conductance by the release holes [13] along the arrangement direction, wherein both the conductance by the release holes and the conductance by the passage holes are increasingly larger from the center of the 4 Appeal 2015-005103 Application 12/816,465 vaporization container to each end portion side of the vaporization container. This portion of claim 1 requires that the conductance for each unit of length along arrangement direction of the vaporization container is such that the conductance by the passage holes 18 is “proportional” to the conductance through the release holes 13. The Specification describes that one way conductance between the passage holes 18 and release holes 13 is made proportional is by arranging the holes so that the spacing between passage holes 18 is denser toward the end portions from the center of the current plate 14 in its longitudinal direction (Spec. 146). The Specification describes that passage holes 18 in current plate 14 make the vaporization material 7 immediately below release holes 13 uniform to address the problem that the vapor is not uniformly dispersed beneath the current plate 14 (Spec. 45, 48). The Specification discloses that without the passage holes 18 arranged in the fashion with denser spacing at the ends, diffusion of the vapor amounts reduces the vapor amounts at the ends of the vaporization container 8 and yields a coating having a non-uniform thickness (H 43, 46). The Specification states that the ratio of conductance through the passage holes 18 of the current plate 14 (C2) to the conductance through the release holes 13 (Cl) is 5.0 or less or preferably 2 or less (Spec. 1 51). The Specification describes that the profile of the conductance Cl and conductance C2 mimic one another in that each is larger at the sides than in the center (Spec. 1 51). In other words, the Specification discloses that “proportional” within the meaning of the claim means that the conductance of the vapor per unit length through the passage holes 18 is made to be the same as the 5 Appeal 2015-005103 Application 12/816,465 conductance per unit length of the vapor through the release holes 13 to provide for a uniform vaporization amount to the substrate being coated. The Examiner finds that Ahn’s Figure 4 shows that conductance by the passage holes is made proportional to conductance by the release holes (Final Act. 4). The Examiner further finds that the claim does not require conductance per unit length as argued by Appellant (Ans. 9, 10). The Examiner findings, however, are erroneous. As a matter of claim construction, the claim plainly requires that “as conductance per unit length” the conductance by the passage holes 18 is made proportional to conductance by the release holes 13. We construe claim 1 supra as requiring that conductance per unit length of the release holes 13 is made to be the same as the conductance per unit length of the passage holes 18. The Examiner findings regarding Ahn’s Figure 4 does not address what the conductance per unit length would be. The Examiner cites to page 7, paragraphs 3 to 5 of the machine translation of Ahn to teach that an “increasing [] flow rate (i.e., conductance) from the center to the end portion” is described (Ans. 7) (emphasis omitted). The Examiner does not explain how paragraphs 3 to 5 of the machine translation describe a proportional relationship for the conductance per unit length of the release holes 13 and passage holes 18 as required by claim 1. The Examiner does not rely on Van Slyke, Negishi, or Iwasaki to address the claim limitation argued by Appellant to be missing from the prior art. On this record, we reverse the Examiner’s § 103(a) rejections. DECISION The Examiner’s decision is reversed. 6 Appeal 2015-005103 Application 12/816,465 ORDER REVERSED 7 Copy with citationCopy as parenthetical citation