Ex Parte IbenDownload PDFBoard of Patent Appeals and InterferencesJun 15, 200910897275 (B.P.A.I. Jun. 15, 2009) Copy Citation UNITED STATES PATENT AND TRADEMARK OFFICE ____________ BEFORE THE BOARD OF PATENT APPEALS AND INTERFERENCES ____________ Ex parte ICKO ERIC TIMOTHY IBEN ____________ Appeal 2009-002064 Application 10/897,275 Technology Center 2800 ____________ Decided:1 June 17, 2009 ____________ Before JOSEPH F. RUGGIERO, ROBERT E. NAPPI, and KARL D. EASTHOM, Administrative Patent Judges. EASTHOM, Administrative Patent Judge. DECISION ON APPEAL 1 The two-month time period for filing an appeal or commencing a civil action, as recited in 37 C.F.R. § 1.304, begins to run from the decided date shown on this page of the decision. The time period does not run from the Mail Date (paper delivery) or Notification Date (electronic delivery). Appeal 2009-002064 Application 10/897,275 2 STATEMENT OF THE CASE Appellant appeals under 35 U.S.C. § 134 from the final rejection of claims 1-25, the only claims pending (App. Br. 5).2 We have jurisdiction under 35 U.S.C. § 6(b). We affirm. Appellant’s claimed device is for protecting electronic components, such as magnetoresisitive (MR) sensors in a tape head or disk head, from electrostatic discharge (ESD) and electrical overstress (EOS) damage. The protective device comprises multiple sets of crossed diodes on a substrate. The substrate can be coupled to a cable. (Abstract; Spec. 2:12-13). Exemplary claims 1 and 21 follow: 1. A device for protecting an electronic device from electrostatic discharge (ESD), comprising: a substrate adapted for coupling to at least one of a multi- element tape drive head and a cable coupled to an electronic device; multiple sets of crossed diodes coupled to the substrate, each set of crossed diodes being coupled to a unique pair of leads; and contact leads coupled to the substrate, the contact leads being in electrical communication with the sets of diodes. 21. A device for protecting an electronic device from electrostatic discharge (ESD), comprising: a chip adapted for coupling to a cable; the chip having multiple sets of crossed diodes, each set of diodes being for providing ESD protection to an individual component of an electronic device coupled to the cable; 2 The Appellant’s Brief (filed Jan. 14, 2008) (“App. Br.”) and Reply Brief (filed June 26, 2008) (“Reply Br.”) and the Examiner’s Answer (mailed Apr. 29, 2008) (“Ans.”) detail the respective positions of the parties. Appeal 2009-002064 Application 10/897,275 3 the chip having contact leads in electrical communication with the sets of diodes, the electrical leads which can be electrically connected to conductors of the cable. The Examiner relies on the following prior art references: Day US 4,475,140 Oct. 2, 1984 Curtis US 5,198,965 Mar. 30, 1993 Murdock US 5,748,412 May 5, 1998 Jiang US 6,288,885 B1 Sep. 11, 2001 Carr US 6,607,923 B2 Aug. 19, 2003 Rathweg US 6,914,748 B2 Jul. 5, 2005 (filed Jun. 5, 2002) Smith US 7,027,275 B2 Apr. 11, 2006 (filed Jan. 10, 2003) The Examiner rejected: Claim 21 as anticipated under 35 U.S.C. § 102(b) by Murdock; Claims 1-5 and 11-16 as obvious under 35 U.S.C. § 103(a) based on Murdock and Carr; Claim 6 as obvious under 35 U.S.C. § 103(a) based on Murdock, Carr, and Smith; Claims 7-10 and 17 as obvious under 35 U.S.C. § 103(a) based on Murdock, Carr, and Day; Claims 13, 19, 22, and 23 as obvious under 35 U.S.C. § 103(a) based on Murdock, Carr, and Jiang; Claim 20 as obvious under 35 U.S.C. § 103(a) based on Murdock, Carr, and Curtis; and Claims 18, 24, and 25 as obvious under 35 U.S.C. § 103(a) based on Murdock and Rathweg. Appeal 2009-002064 Application 10/897,275 4 ISSUES Appellant’s arguments (App. Br. 10; Reply Br. 3) with respect to the anticipatory rejection of claim 21 assert the failure of Murdock to disclose a cable and multiple diode sets. Appellant’s arguments present the following issue: Did Appellant show that the Examiner erred in finding that Murdock discloses “a chip adapted for coupling to a cable; the chip having multiple sets of crossed diodes” as recited in claim 21? Appellant’s arguments (App. Br. 11-13) with respect to the obviousness rejection based on Murdock and Carr focus on claims 1, 4, and 5. Appellant’s arguments present the following issues: Did Appellant demonstrate that the Examiner erred in finding that Murdock and Carr collectively teach 1) multiple sets of crossed diodes each coupled to a unique pair of leads as set forth in claim 1; 2) wherein each set of crossed diodes in claim 1 includes multiple diodes aligned in series in each direction as required by dependent claim 4; and 3) wherein for each set of crossed diodes in claim 4, the number of diodes in one bias direction is different than a number of diodes in another bias direction as required by dependent claim 5? Finally, with respect to claims 7-10 and 17, Appellant asserts (App. Br. 14) that Day is nonanalogous art. Thus, the final issue presented is: Is Day nonanalogous art? FINDINGS OF FACT (FF) Appellant’s Disclosure 1. Appellant does not provide a definition for a cable. Appeal 2009-002064 Application 10/897,275 5 2. Appellant refers to a cable 504 and Figure 5 for support of the cable limitation in claims 1 and 21 (App. Br. 7 (citing Spec. 19:14 et seq.; Fig. 5)). 3. Figure 7 depicts, according to the Specification, “conductive wire traces 612 in the upper metallized layer” of cable 606 (Spec. 20:21-23). Insulative layers and chips may be bonded to the cable (Spec. 21:8-19). 4. Appellant states that “since modern tape heads have multiple read elements, it can be expensive to add packages containing individual diodes or pairs of diodes for each element, particularly when the head and cable are scrapped during the testing phase” (Spec. 5:8-10). 5. Appellant employs a resistor “as an option,” which can be “connected to each end of the MR sensor and to ground to discharge any common mode charge built up on the leads” (Spec. 13:12-14). Murdock 6. Murdock discloses protecting, preferably with diodes having a nonlinear resistance (col. 2, ll. 28-47), a head assembly comprising a magnetoresistive sensor connected via “at least two electrical conductors” to detection circuitry (col. 1, ll. 18-21). Murdock discloses “additional reading or writing sensor/transducers” in a head 28 connected in the same manner to the detection circuitry 16 (col. 3, ll. 60-64). 7. Murdock describes the conductors as follows: first and second conductors electrically connecting the magnetoresisitive sensor element and the detection circuitry typically comprise conductive traces, bonding pads and electrical wires . . . . The bonding pads provide a surface by which electrical conductors such as wire may be attached to electrically connect detection circuitry and the magnetoresisitive sensor. The wires are typically tacked or Appeal 2009-002064 Application 10/897,275 6 bonded to the bonding pads and to at least one surface of the slider. The wires further extend along the gimbal, the load beam and the arm to the detection circuitry. (Col. 1, ll. 51-65 (emphasis added)). 8. Murdock also depicts and describes conductive traces 44a-44d: fabricated or deposited upon a dielectric material such as a polyimide . . . which is preferably flexible to form a flex circuit 50. Conductive traces 44a-44d preferably extend beyond the dielectric material of flex circuit 50 in the form of flying leads 49 . . . . Flex circuit 50 is adhesively secured to suspension 24 . . . . Flex circuit 50 and conductive traces 44a-44d extend along support arm 22 and actuator arm 20 (shown in FIG. 1) to detection circuitry 16. (Col. 4, l. 64 to col. 5, l. 15 (emphasis added); see also Figs. 1, 2). 9. “[B]undled wires or other conventional conducting interconnects may be used in lieu of the flexible circuit 50 and conductive traces 44 for providing an electrical connection between magnetoresisitive sensor element 34 and detection circuitry 16.” (Col. 5, ll. 24-29). 10. Murdock depicts and describes crossed diodes comprising three or more diodes 70 in one series branch connected in parallel to three or more oppositely directed diodes 72 in another series branch. Both diode branches constitute a diode package 30, which protectively shunts magnetoresistive sensor 34. (Figs. 2, 3c; col. 7, ll. 6-18). 11. Figure 2 depicts diode package 30 connected to the magnetoresistive sensor 34 through the flex circuit 50 traces 44a and 44b at contact pads 42a and 42b (col. 4, ll. 54-63). Figure 8 depicts a similar diode package 230, which “may have any one of the circuit configurations 30a-30f illustrated in FIGS. 3a-3f” (col. 11, ll. 42-44). Diode assembly “preferably Appeal 2009-002064 Application 10/897,275 7 includes at least one small surface packaged diode chip die mounted to bond pads . . .” (col. 11, ll. 27-28). 12. “Although depicted as electrically interconnecting contact pads 42a and 42b of electrical conductors 18a and 18b, respectively, diode assembly 30 may be positioned across electrically conductors 18a and 18b anywhere between magnetoresistive sensor element 34 and detection circuitry 16” (col. 6, ll. 21-25). 13. Murdock also discloses diode sets described as assemblies and arrays 30 and 130 each mounted on individual magnetoresistive sensor sliders 34 of a plurality of such sliders in a wafer to protect the slider sensors from electrostatic discharge during handling (col. 8, ll. 26-47). Figures 6 and 7 depict exposed conductors 206 of diodes 200 and 202 on the wafer (see also col. 8, ll. 48-63). As an alternative to the direct diode fabrication on sliders 34, separate diodes or diode arrays 30 or 130 in “[s]mall surface mount diode chips, or preferably their even smaller unpackaged dies, may be bonded onto and across portions of the electrical conductors 18a and 18b, such as conductive traces 40a and 40b or contact pads 42a and 42b, on slider 32” (col. 8, ll. 43-47). 14. “As can be appreciated, the voltage-current characteristics of diode assembly 30 must be tailored to the operation conditions of magnetoresistive sensor element 34 and the level of electrostatic discharge protection required” (col. 6, ll. 31-34). As examples, Murdock discloses different diode configurations of varying numbers of parallel and series diodes in Figures 3a-3d for different diode packages 30. Figure 3d shows a single Zener diode providing asymmetric overvoltage protection relative to the polarity of voltage spikes (i.e., the Zener diode turns on and thereby Appeal 2009-002064 Application 10/897,275 8 shunts lesser magnitudes of negative pulses as compared to positive pulses). (See col. 7, ll. 19-40). Carr 15. Carr depicts three separate crossed diode sets each connected to a different set of leads to protect an MR component 12: crossed diodes D1, D2 connected to leads R+ and R-; crossed diodes D3 and D4 connected to lead R+ and an implied lead on shield 118; and crossed diodes D5 and D6 connected to lead R- and another implied lead on shield 118. The R- lead connects directly to ground. (Fig. 12). 16. Carr’s “slider 13 supports one or more magnetic read/write transducers 21, also referred to as MR read/inductive heads . . .” (col. 5, ll. 27-28). “[E]ach actuator may support a number of sliders” (col. 6, l. 2). Carr’s system applies to both disk and tape storage systems (col. 5, ll. 18- 22). Day 17. Day discloses providing a path to ground from a diode 35 through a “leakage resistor 37” in the low voltage control portion (e.g., 8 volts) of a circuit (col. 3, ll. 3-6; col. 4, ll. 23-25; see also Fig.; Abstract). Day explains the reason for the leakage resistor: “This resistor prevents stray voltage build-up in the floating control circuit due to voltage induced into the probe circuitry by stray magnetic fields or like influences on the probe lead” (col. 4, ll. 25-29). PRINCIPLES OF LAW “[T]he examiner bears the initial burden, on review of the prior art or on any other ground, of presenting a prima facie case of unpatentability.” In Appeal 2009-002064 Application 10/897,275 9 re Oetiker, 977 F.2d 1443, 1445 (Fed. Cir. 1992). Under § 102, Appellant may sustain this burden by showing that the prior art reference relied upon by the Examiner fails to disclose an element of the claim. “It is axiomatic that anticipation of a claim under § 102 can be found only if the prior art reference discloses every element of the claim.” See In re King, 801 F.2d 1324, 1326 (Fed. Cir. 1986) (citing Lindemann Maschinenfabrik GMBH v. Am. Hoist & Derrick Co., 730 F.2d 1452, 1457 (Fed. Cir. 1984)). “A reference anticipates a claim if it discloses the claimed invention ‘such that a skilled artisan could take its teachings in combination with his own knowledge of the particular art and be in possession of the invention.’” In re Graves, 69 F.3d 1147, 1152 (Fed. Cir. 1995) (quoting In re LeGrice, 301 F.2d 929, 936 (CCPA 1962)) (emphasis deleted). Under § 103, a holding of obviousness can be based on a showing that “there was an apparent reason to combine the known elements in the fashion claimed.” KSR Int’l Co. v. Teleflex Inc., 550 U.S. 398, 418 (2007). Such a showing requires: “some articulated reasoning with some rational underpinning to support the legal conclusion of obviousness” . . . . [H]owever, the analysis need not seek out precise teachings directed to the specific subject matter of the challenged claim, for a court can take account of the inferences and creative steps that a person of ordinary skill in the art would employ. Id. (citation omitted). If the Examiner makes such a showing, the burden then shifts to Appellant to overcome the prima facie case with argument and/or evidence. Obviousness is then determined on the basis of the evidence as a whole and the relative persuasiveness of the arguments. See Oetiker, 977 F.2d at 1445. Appeal 2009-002064 Application 10/897,275 10 “In order to rely on a reference as a basis for rejection of the applicant’s invention, the reference must either be in the field of the applicant’s endeavor, or, if not, then be reasonably pertinent to the particular problem with which the inventor was concerned.” Id. at 1447. ANALYSIS ANTICIPATION Murdock Claim 21 Appellant’s argument (App. Br. 10) that Murdock’s “conductive traces are not a cable, but rather [are] formed on a slider” because “the conductive traces are fabricated on the slider 32, preferably deposited on a wafer containing a plurality of sliders,” lacks merit. Murdock’s chip 30, for example, comprising diode arrays with multiple sets of crossed diodes, is connected to the cable of flex circuit 50 (FF 6-13), as the Examiner found (Ans. 3, 4), or to Murdock’s “bundled wires or other conventional conducting interconnects” (FF 9). Appellant’s reference to other embodiments notwithstanding, Murdock discloses connecting the chip diode array package anywhere along the cable (FF 12). Moreover, claim 21 merely requires “a chip adapted for coupling to a cable.” In other words, the claim does not recite an affirmative cable connection. Even if claim 21 requires a cable connection, Appellant’s assertion that Murdock’s wires do not constitute a cable connection (App. Br. 10) fails to explain how any cable connection recited in claim 1 is patentably distinct from Murdock’s disclosed cable connections described above and by the Examiner (Ans. 3-4). Murdock’s flex cable 50 comprising conductive Appeal 2009-002064 Application 10/897,275 11 traces, and conventional bundled wires, appear similar to Appellant’s disclosed cables (compare FF 7-9 with FF 1-4). Appellant shifts the argument in the Reply Brief (Reply Br. 3) and asserts for the first time that Murdock’s diodes in Figure 3c do not comprise “multiple sets of crossed diodes, each set of diodes being for providing ESD protection to an individual component of an electronic device . . . .” According to Appellant (id.), Murdock only discloses a “single set” of crossed diodes that protects a single device 34, because “Murdock is directed to a disk drive system, which has only one MR [magnetoresistive] element in the head.” Appellant’s argument is not persuasive for several reasons. First, Murdock discloses “additional reading or writing sensor/transducers” in a head (FF 6). As such, skilled artisans would recognize that Murdock implicitly discloses protecting all such sensors (see Graves, 69 F.3d at 1152). Second, as the Examiner implicitly found, claim 21 does not require protection for more than one “individual component,” even though the claim requires multiple sets of diodes to protect that one component. “Construing claims broadly during prosecution is not unfair to the applicant . . . because the applicant has the opportunity to amend the claims to obtain more precise claim language.” In re Am. Acad. of Sci. Tech Ctr., 367 F.3d 1359, 1364 (Fed. Cir. 2004). Finally, as Appellant notes (see supra citing (App. Br. 10)), Murdock discloses a wafer containing a plurality of sliders. Additionally, Murdock discloses a diode set mounted on each slider in the wafer (FF 13). Murdock’s wafer with multiple sets of diodes each protecting a separate MR slider component (FF 13) constitutes the claimed chip. That is, Murdock Appeal 2009-002064 Application 10/897,275 12 refers to a “small surface packaged diode chip die” (FF 11) and “[s]mall surface mount diode chips, or preferably their even smaller unpackaged dies” (FF 13), thus Murdock’s wafer reasonably constitutes an unpackaged chip die – i.e., a chip. Claim 21 recites “a chip adapted for coupling to a cable . . . [and chip diodes] for providing ESD protection to an individual component of an electronic device coupled to the cable.” As noted above, the claim merely specifies an intended use for the chip – an intention to eventually attach it to a cable. Therefore, Murdock’s wafer chip meets claim 21 because the chip, carrying multiple sets of diodes each shunting an individual MR sensor, is “adapted for coupling to a cable” at, for example, the exposed conductors 206 (i.e., “contact leads”) of the wafer (FF 12). Accordingly, we will sustain the Examiner’s rejection of claim 21. OBVIOUSNESS Murdock and Carr Claims 1-3 and 11-16 Appellant argues (App. Br. 11), with respect to claim 1, that each diode set in Figure 12 of Carr (D1-D2, D3-D4, D5-D6) “is in actuality coupled to the same pair of leads.” The argument lacks merit. Carr discloses each of the three different diode sets connected to a unique set of leads (FF 14) as the Examiner found (Ans. 5, 13-14). Appellant also asserts (App. Br. 12) that the Examiner’s logic for modifying Murdock based on Carr, i.e., to protected different elements, is erroneous because Carr’s Figure 12 only depicts protection of one element. This argument does not address the Examiner’s additional rationale (Ans. 15) of “redundant protection for the same element by providing multiple short circuit path[s] . . . .” The Examiner’s rationale, supported by Carr’s Appeal 2009-002064 Application 10/897,275 13 disclosure (see FF 15), constitutes “‘some articulated reasoning with some rational underpinning to support the legal conclusion of obviousness,’” which Appellant has not rebutted. See KSR, 550 U.S. at 418 (citation omitted). Additionally, Murdock and Carr each disclose multiple sensors each having unique leads and suggest protection thereof (see FF 6, 7, 13, 15). Therefore, we will sustain the Examiner’s rejection of claim 1. For the same reasons, we will also sustain the Examiner’s rejection of claims 2, 3 and 11-16, which depend from claim 1, because Appellant relies on the same arguments presented for claim 1 (see App. Br. 12). Claims 4 and 5 Appellant argues (App. Br. 13) with respect to claim 4 that “Murdock only discloses a single set of crossed diodes having multiple diodes in series (Fig. 3c).” The Examiner’s rejection, based on obviousness, posits that Murdock discloses multiple sets of diodes, whereas Carr discloses connecting similar such crossed diode sets each to a unique set of leads (Ans. 5-6). As such, it would have been obvious to substitute Murdock’s crossed set of series diodes (FF 10) for each of Carr’s sets of single crossed diodes at each unique lead (FF 15) to tailor the diode protection to each sensor as Murdock teaches (FF 10, 14). Additionally, as noted above, Murdock and Carr each disclose multiple sensors each implicitly having unique leads and diode protection (see FF 6, 16). With respect to claim 5, Appellant’s arguments notwithstanding (App. Br. 13), Murdock does suggest altering the number of diodes in each branch for asymmetrical protection depending on the relative polarity and strength of anticipated undesired voltage spikes. For example, Figure 3d shows Appeal 2009-002064 Application 10/897,275 14 asymmetric protection based on different polarities of voltage spikes and Murdock teaches tailoring protection to each sensor (FF 14). Murdock’s Figure 3d discloses one diode in one branch and zero in the other. As such, altering the number of series diodes in each branch of a diode set having multiple diodes (FF 10; see Murdock, Fig. 3c) to correspond to the different levels of negative and positive spikes shorted according to Murdock’s teachings of asymmetrical protection (see FF 14; Murdock, Fig. 3d) would have been obvious. Appellant has not presented evidence or argument to show that such a modification would have been “uniquely challenging or difficult for one of ordinary skill in the art” or would have “represented an unobvious step over the prior art.” Leapfrog Enters., Inc. v. Fisher-Price, Inc., 485 F.3d 1157, 1162 (Fed. Cir. 2007). Appellant’s arguments, apparently based on a lack of anticipation (see App. Br. 13), fail to demonstrate Examiner error. Therefore, we will also sustain the Examiner’s rejection of claims 4 and 5. Murdock, Carr, and Day Claims 7-10 and 17 Appellant’s argument (App. Br. 14) with respect to claim 7, that Day is not analogous art, also fails to demonstrate Examiner error. As the Examiner found: “The leakage resistor of Day, solves the same problem as the invention: to prevent stray/unwanted voltage buildup to protect a device (see Day, Column 4, lines 23-29) by providing a path for the residual charge to escape to ground, and therefore, Day reference is analogous art” (Ans. 16- 17). Appellant asserts that “applicant’s endeavor” and “particular problem” of concern are “providing ESD protection for a tape drive head or an electronic device” (App. Br. 14). Appeal 2009-002064 Application 10/897,275 15 This assertion does not demonstrate error. The argument improperly merges the two prongs of the analogous art test, see Oetiker, 977 F.2d at 1447, into one prong, and accordingly, lacks a legal basis. Day is concerned with dissipating, and thereby preventing, charge build up in low voltage circuits (FF 17). Thus, Day’s disclosure pertains to one of Appellant’s specific problems of preventing charge build-up and also pertains to Appellant’s general field of endeavor of preventing damage to components caused by the subsequent discharge of any such charge build-up. Appellant and Day solve the specific problem of charge build-up in the same manner, by providing a leakage resistor path to ground (see FF 5, 17). As such, Day is at least “reasonably pertinent to the particular problem with which the inventor was concerned.” Oetiker, 977 F.2d at 1447. Appellant’s related arguments (Reply Br. 11), inter alia, that Day is not concerned with preventing a voltage spike, that Day does not provide crossed diodes, and that Day’s resistor “in the escape path” of Murdock’s protective diode assembly “would slow such escape,” do not address the “leakage” resistor’s particular purpose of dissipating charge prior to a need for the charge escape – i.e., eliminating the charge necessary for a discharge–the same purpose for which Appellant provides a leakage resistor (see FF 5). As long as the diodes shunt the MR sensor, as occurs in Murdock and Carr, providing Day’s leakage resistor path from the shunt to ground, as set forth in claim 7 and as generally proposed by the Examiner (see Ans. 8), does not defeat the purpose of the shunt or slow any diode conduction, contrary to Appellant’s arguments (Reply Br. 11). Further, Murdock’s or Carr’s parallel diodes themselves inherently include parallel nonlinear resistance (see FF 6, 9), and one of Carr’s diode sets connects to a Appeal 2009-002064 Application 10/897,275 16 lead which connects directly to ground (FF 15); therefore, additional resistors would not thwart the diode circuits’ protective function. Accordingly, we will sustain the Examiner’s rejection, based on Murdock, Carr, and Day, of claim 7, and of claims 8-10 and 17, which were not separately argued. Murdock, Carr, and either Smith, Jiang, or Curtis Claims 6, 133, 19, 20, 22, and 23 For the reasons above, we will also sustain the rejections of claim 6, based on the added teaching of Smith; claims 13, 19, 22, and 23, based on the added teaching of Jiang; and claim 20, based on the added teaching of Curtis. Appellant relies on arguments presented for claims 1 and 21, which are not persuasive of Examiner error for reasons discussed above. (See App. Br. 9, 12-15). Murdock and Rathweg Claims 18, 24, and 25 We will also sustain the rejection of claim 24, which depends from claim 21, because Appellant relies on arguments presented for claim 21, which are not persuasive of Examiner error as explained above. We will also sustain the rejection of independent claim 25, and of dependent claim 18 which depends from claim 1. Appellant relies on arguments presented for claim 1, rejected based on Murdock and Carr, which are not persuasive of Examiner error for reasons explained above. Moreover, the Examiner relies on a different combination of references, Murdock and Rathweg, to teach the limitations of claims 18 and 25 (Ans. 3 The rejection of claim 13, separately rejected without Jiang, was sustained above. Appeal 2009-002064 Application 10/897,275 17 10-12). As such, Appellant’s arguments based on any alleged shortcomings of the combination of Murdock and Carr with respect to claim 1 fail to demonstrate error with respect to the rejection of dependent claim 18 and independent claim 25 based on the combination of Murdock and Rathweg (see Ans. 10-12). For example, the Examiner makes unchallenged findings based on the latter combination (Ans. 10-12) to support the obviousness of multiple sets of crossed diodes. With further respect to independent claim 25, Appellant, relying on arguments presented for claim 1, asserts (App. Br. 16) that Murdock’s Figure 3c fails to show “multiple sets of crossed diodes.” However, claim 25 does not recite “a unique pair of leads” as claim 1 recites, so that Appellant’s reliance on arguments presented for claim 1 fails to demonstrate error. Thus, as the Examiner found (Ans. 10), any pair of two crossed diodes in Murdock’s Figure 3c constitutes one set of a plurality (see FF 9) with multiple such sets bolstered further by the Examiner’s findings referenced supra as based on the combination of Murdock and Rathweg. Additionally, as noted above, Murdock discloses multiple sensors each implicitly having unique leads and diode protection (see FF 6). Accordingly, we will sustain the Examiner’s rejection, based on Murdock and Rathweg, of claims 18, 24, and 25. CONCLUSION Appellant did not show that the Examiner erred in finding that Murdock discloses the cable recited in claim 21. Appellant also did not demonstrate that the Examiner erred in finding that Murdock and Carr collectively teach 1) multiple sets of crossed diodes each coupled to a unique Appeal 2009-002064 Application 10/897,275 18 pair of leads as set forth in claim 1; 2) wherein each set of crossed diodes in claim 1 includes multiple diodes aligned in series in each direction as required by dependent claim 4; and 3) wherein for each set of crossed diodes in claim 4, the number of diodes in one bias direction is different than a number of diodes in another bias direction as required by dependent claim 5. Finally, with respect to claims 7-10 and 17, Day is analogous art. DECISION We affirm the Examiner’s decision rejecting claims 1-25. No time period for taking any subsequent action in connection with this appeal may be extended under 37 C.F.R. § 1.136(a)(1)(iv). AFFIRMED babc Zilka-Kotab, PC P.O. BOX 721120 SAN JOSE, CA 95172-1120 Copy with citationCopy as parenthetical citation