Ex Parte HaibaraDownload PDFPatent Trial and Appeal BoardMar 28, 201812592706 (P.T.A.B. Mar. 28, 2018) Copy Citation UNITED STA TES p A TENT AND TRADEMARK OFFICE APPLICATION NO. FILING DATE 12/592,706 12/01/2009 22045 7590 03/30/2018 BROOKS KUSHMAN P.C. 1000 TOWN CENTER TWENTY-SECOND FLOOR SOUTHFIELD, MI 48075 FIRST NAMED INVENTOR Teruo Haibara UNITED STATES DEPARTMENT OF COMMERCE United States Patent and Trademark Office Address: COMMISSIONER FOR PATENTS P.O. Box 1450 Alexandria, Virginia 22313-1450 www .uspto.gov ATTORNEY DOCKET NO. CONFIRMATION NO. WSAG0249PUS 5730 EXAMINER COLEMAN, RY AN L ART UNIT PAPER NUMBER 1714 NOTIFICATION DATE DELIVERY MODE 03/30/2018 ELECTRONIC Please find below and/or attached an Office communication concerning this application or proceeding. The time period for reply, if any, is set in the attached communication. Notice of the Office communication was sent electronically on above-indicated "Notification Date" to the following e-mail address( es): docketing@brookskushman.com kdilucia@brookskushman.com PTOL-90A (Rev. 04/07) UNITED STATES PATENT AND TRADEMARK OFFICE BEFORE THE PATENT TRIAL AND APPEAL BOARD Ex parte TERVO HAIBARA 1 Appeal2017-003529 Application 12/592,706 Technology Center 1700 Before BRADLEY R. GARRIS, BEYERL YA. FRANKLIN, and DONNA M. PRAISS, Administrative Patent Judges. FRANKLIN, Administrative Patent Judge. DECISION ON APPEAL Appellant requests our review under 35 U.S.C. § 134 of the Examiner's final decision rejecting claims 30-38, 40, and 42--46. We have jurisdiction over the appeal under 35 U.S.C. § 6(b ). STATEMENT OF THE CASE Claim 30 is illustrative of Appellant's subject matter on appeal and is set forth below: 1 Appellant identifies the real party in interest as Siltronic AG. See Appeal Br. 3. Appeal2017-003529 Application 12/592,706 30. A cleaning method of removing wax which is adhered to a semiconductor wafer surface, by using a cleaning liquid, the cleaning method comprising: introducing a gas to the cleaning liquid by using a micro bubble generating device in order to generate microbubbles in the cleaning liquid, and immersing a semiconductor wafer in the cleaning liquid which contains the microbubbles generated by the gas to clean a surface of the semiconductor wafer, wherein wax adhering to the surface of the semiconductor wafer is uniformly removed while dissolving the wax in the cleaning liquid without exfoliating the wax as a solid material. The Examiner relies on the following prior art references as evidence of unpatentability: Amemiya Chou Hasegawa US 2001/0025017 Al US 2004/0187891 Al US 2006/0137719 Al THE REJECTIONS Sept. 27, 2001 Sept. 30, 2004 June 29, 2006 1. Claims 30-38, 40, 42, and 44--46 are rejected under pre-AIA 35 U.S.C. § 103(a) as being unpatentable over Amemiya in view of Hasegawa. 2. Claim 43 is rejected under pre-AIA 35 U.S.C. § 103(a) as being unpatentable over Amemiya in view of Hasegawa and further in view of Chou. 3. Claim 46 is rejected under 35 U.S.C. § 112(d) or pre-AIA 35 U.S.C. § 112, fourth paragraph, as being of improper dependent form. ANALYSIS Upon consideration of the evidence and each of the respective positions set forth in the record, we find that the preponderance of evidence supports Appellant's position in the record regarding Rejections 1 and 2. 2 Appeal2017-003529 Application 12/592,706 Accordingly, we reverse Rejections 1 and 2 for the reasons discussed below, with a focus on the dispositive argument in this case. With regard to Rejection 3, we affirm, for the reasons provided in the record and discussed below. As an initial matter, as mentioned by both parties in the record, there was a previous appeal in this case (Appeal No. 2013-002509). In this previous appeal, independent claim 1 2 was one of the claims under consideration, and the Examiner relied upon the same prior art. In this case before us, independent claim 30 is the independent claim under consideration, and a new issue is raised in the record that was not raised by Appellant in the previous Appeal No. 2013-002509. This issue is whether Amemiya teaches away from the proposed combination in support of unobviousness based upon Amemiya's teaching to avoid bubbling. This issue is addressed below. Rejection 1 Appellant argues, inter alia, that Amemiya teaches to avoid bubbling. Appeal Br. 5 and 6; Reply Br. 4; Amemiya i-f 33. As such, Appellant argues that motivation is lacking in making the proposed modification of incorporating micro bubbling (from the teachings of Hasegawa) into the process of Amemiya. 2 This independent claim 1 recited: 1. A method for removing wax from a semiconductor wafer surface, comprising contacting a surface of the semiconductor wafer which has wax thereon with a cleaning liquid containing microbubbles, the microbubbles supplied to the cleaning liquid by a microbubble generating device which introduces gas into the cleaning liquid. 3 Appeal2017-003529 Application 12/592,706 The Examiner responds by stating that this undesired bubbling discussed in Amemiya concerns the amount of cleaning agent in the cleaning solution. Ans. 11. The Examiner states that this teaching does not indicate the proposed combination "is somehow doomed to fail". Ans. 11. The Examiner makes the argument that the bubbling technique of Hasegawa is carefully controlled and that it should not be conflated with the bubbling mentioned in Amemiya. Ans. 11. In reply, Appellant presents reasons (Reply Br. 4---6) essentially for making the point that the Examiner's view that the bubbling avoided in Amemiya is not to be conflated with the bubbling in Hasegawa is insufficiently supported. We note that whether a reference teaches away from a claimed invention is a question of fact. In re Harris, 409 F.3d 1339, 1341 (Fed. Cir. 2005). In the instant case, Appellant's point that Amemiya teaches to avoid bubbling is well taken because this teaching amounts more to discrediting/inoperability over mere disfavored properties or minor drawbacks. Amemiya in fact teaches that amounts of the cleaning agent are chosen so as to avoid bubbling. Amemiya i-f 33. "If the proposed modification would render the prior art invention being modified unsatisfactory for its intended purpose, then there is no suggestion or motivation to make the proposed modification." In re Gordon, 733 F.2d 900, 902 (Fed. Cir. 1984). We likewise accept the point made by Appellant that the Examiner's view that the bubbling avoided in Amemiya is not to be conflated with the bubbling in Hasegawa is insufficiently supported in the record for essentially the reasons discussed in the record by Appellant. 4 Appeal2017-003529 Application 12/592,706 In view of the above, we reverse Rejection 1. We also reverse Rejection 2 because the Examiner does not rely upon Chou to cure the stated deficiencies in the combination of Amemiya in view of Hasegawa. Rejection 3 Appellant does not address Rejection 3 in the Appeal Brief or in the Reply Brief. We thus summarily affirm this rejection. DECISION Rejections 1 and 2 are reversed. Rejection 3 is affirmed. TIME PERIOD No time period for taking any subsequent action in connection with this appeal may be extended under 37 C.F.R. § 1.136(a). See 37 C.F.R. § 1.136(a)(l )(iv). AFFIRMED-IN-PART 5 Copy with citationCopy as parenthetical citation