Ex Parte Colvin et alDownload PDFPatent Trial and Appeal BoardMar 14, 201612948309 (P.T.A.B. Mar. 14, 2016) Copy Citation UNITED STA TES p A TENT AND TRADEMARK OFFICE APPLICATION NO. FILING DATE 12/948,309 11/17/2010 29393 7590 03/16/2016 ESCHWEILER & AS SOCIA TES, LLC NATIONAL CITY BANK BUILDING 629 EUCLID A VE., SUITE 1000 CLEVELAND, OH 44114 FIRST NAMED INVENTOR Neil K. Colvin UNITED STATES DEPARTMENT OF COMMERCE United States Patent and Trademark Office Address: COMMISSIONER FOR PATENTS P.O. Box 1450 Alexandria, Virginia 22313-1450 www .uspto.gov ATTORNEY DOCKET NO. CONFIRMATION NO. EATNP299US 3630 EXAMINER OSENBAUGH-STEW AR, ELIZA W ART UNIT PAPER NUMBER 2881 NOTIFICATION DATE DELIVERY MODE 03/16/2016 ELECTRONIC Please find below and/or attached an Office communication concerning this application or proceeding. The time period for reply, if any, is set in the attached communication. Notice of the Office communication was sent electronically on above-indicated "Notification Date" to the following e-mail address( es): Docketing@eschweilerlaw.com PTOL-90A (Rev. 04/07) UNITED STATES PATENT AND TRADEMARK OFFICE BEFORE THE PATENT TRIAL AND APPEAL BOARD Ex parte NEIL K. COL VIN and TSEH-JEN HSIEH Appeal2014-007322 Application 12/948,309 Technology Center 2800 Before JEAN R. HOMERE, CAROLYN D. THOMAS, and JOSEPH P. LENTIVECH, Administrative Patent Judges. THOMAS, Administrative Patent Judge. DECISION ON APPEAL Appellants seek our review under 35 U.S.C. § 134(a) of the Examiner finally rejecting claims 1-5 and 7-20, all the pending claims in the present application. Claim 6 is canceled. We have jurisdiction over the appeal under 35 U.S.C. § 6(b). We AFFIRM. The present invention relates generally to an ion implant system for improving performance and extending lifetime of an ion source. See Abstract. Appeal2014-007322 Application 12/948,309 Claim 1 is illustrative: 1. An ion implantation system for improving performance and extending lifetime of an ion source in an ion implanter compnsmg: an ion source assembly comprising a dopant gas controller, a co-gas controller, and an ion source chamber, the dopant gas controller operatively controlling the rate and flow of a fluorine- containing dopant gas source into the ion source chamber, and the co- gas controller operatively controlling the rate and flow of a co-gas into the ion source chamber, wherein the operative control of the rate and flow of the co-gas into the ion source chamber is adjusted during operation of the ion implantation system, the co-gas reacting with the fluorine-containing dopant gas; a beam line assembly that receives the ion beam from the ion source and processes the ion beam; and a target location that receives the ion beam from the beam line assembly. Appellants appeal the following rejections: RI. Claims 1-5, 7-9, 11-13, 15-17, 19, and 20 are rejected under 35 U.S.C. § 103(a) as being unpatentable over Perel (US 7;586;109 B2; Sept 8, 2009) and Ziegler (US 2003/0234371 Al, Dec. 25, 2003); and R2. Claims 10, 14, and 18 are rejected under 35 U.S.C. § 103(a) as being unpatentable over Perel, Ziegler, and Mori (US 6,215,245 B 1, Apr. 10, 2001). ANALYSIS Claims 1-5 and 7-20 Issue: Did the Examiner err in finding that the combined teachings of Perel and Ziegler teach or suggest "the rate and flow of the co-gas into the ion source chamber is adjusted," as set forth in claim 1? 2 Appeal2014-007322 Application 12/948,309 Appellants contend "that combining the teachings of Perel et al. and Ziegler is improper because of the disparate manner in which the systems operate and the problems being solved by the different systems preclude one of ordinary skill from having a reasonable likelihood of success" (App. Br. 5) (emphasis omitted). Appellants further contend that "[t]he purpose for which Ziegler adjusts a flow rate of gas and co-gas is directed narrowly to thin film formation ... None of the resultant thin film benefits associated with the control scheme of Ziegler have any applicability to the ion implantation system of Perel et al." (id. at 6). The Examiner finds that "Perel et al. discloses that two (or in some embodiments three) gases can be combined in an ion source ... the amount of co-gas needed would also differ" and "adding adjustability to a system or method is generally considered to be obvious" (see Ans. 2-3). The Examiner further finds that "[b ]oth methods take gases and ionize them in an ion source, then outputs ions to be used in semiconductor manufacturing processes" (Ans. 3). We agree with the Examiner. We begin by noting that Appellants do not dispute the Examiner's reliance on Ziegler regarding the claimed "the operative control of the rate and flow of the co-gas into the ion source chamber is adjusted." Rather, Appellants dispute the comb inability of Zeigler' s teachings with Perel' s teachings. On this record, we see no error in the Examiner's combining Perel's technique for improving and extending the lifetime of an ion source with Zeigler' s method for generating reactive ions. Although Appellants contend that the purpose for Ziegler's adjustments of flow rate is narrowly directed to thin film formation (see App. Br. 6), we highlight that Ziegler specifically 3 Appeal2014-007322 Application 12/948,309 states that its' invention relates particularly to "the delivery of gas to physical or chemical vacuum or vapor chambers" (i-f l) and "[ t ]he scope of this patent is ... specifically with the mixture, feedback and regulation of gases fed into an ion source and physical or chemical vapor chamber systems" (i-f 2). In other words, Ziegler's purpose does not appear to be as narrow as Appellants suggest, but rather looks at the broader concept of the delivery, mixture, feedback, and regulation of gases into a chamber system. In fact, Appellants fail to direct our attention to any disclosure in Ziegler that limits its application to only thin film chemistry (see Ziegler i-f 17). Similarly, Perel discloses "a dopant gas controller for releasing a predetermined amount of dopant gas from a dopant gas source into an ion source chamber" (4:48-50). Thus, we agree with the Examiner that both Ziegler's and Perel's "methods take gases and ionize them in an ion source" (Ans. 3). Furthermore, there is no requirement that the problem solved by the secondary reference be discussed by the primary reference to apply the teachings of the secondary reference in a rejection under 35 U.S.C. § 103. The Supreme Court has held that in analyzing the obviousness of combining elements, a court need not find specific teachings, but rather may consider "the background knowledge possessed by a person having ordinary skill in the art" and "the inferences and creative steps that a person of ordinary skill in the art would employ." See KSR Int'! Co. v. Teleflex Inc., 550 U.S. 398, 418 (2007). To be nonobvious, an improvement must be "more than the predictable use of prior art elements according to their established functions," and the basis for an obviousness rejection must include an 4 Appeal2014-007322 Application 12/948,309 "articulated reasoning with some rational underpinning to support the legal conclusion of obviousness." Id. Here, the Examiner has found actual teachings in the prior art and has provided a rationale for the combination. Specifically, the Examiner finds "[i]t would have been obvious ... to modify the ion implantation system of Perel et al. to include the continuous flow control of Ziegler so that the rate of ion production could be increased when needed and the rate of scavenging increased when metal build-up is heavy" (see Final Act. 4). Having established that this knowledge was in the art, the Examiner could then rely on a conclusion of obviousness "from common knowledge and common sense of the person of ordinary skill in the art without any specific hint or suggestion in a particular reference." See In re Bozek, 416 F.2d 1385, 1390 (CCP A 1969). Here, the Examiner applies common knowledge and common sense in finding that "[a]dding the step of adjusting the flow rates of the different gases would allow a person having ordinary skill in the art to optimize the method in relation to the condition of the system" (Ans. 2-3). Accordingly, we find that the Examiner has provided sufficient motivation for modifying Perel with the teachings of Ziegler, and we will sustain the obviousness rejections of claims 1-5 and 7-20. DECISION We affirm the Examiner's§ 103(a) rejections. 5 Appeal2014-007322 Application 12/948,309 No time period for taking any subsequent action in connection with this appeal may be extended under 37 C.F.R. § 1.136(a)(l )(iv). AFFIRMED 6 Copy with citationCopy as parenthetical citation