Ex Parte Chiang et alDownload PDFBoard of Patent Appeals and InterferencesApr 26, 201010921604 (B.P.A.I. Apr. 26, 2010) Copy Citation UNITED STATES PATENT AND TRADEMARK OFFICE ____________ BEFORE THE BOARD OF PATENT APPEALS AND INTERFERENCES ____________ Ex parte TONY P. CHIANG, KARL F. LEESER, JEFFREY A. BROWN, and JASON E. BABCOKE ____________ Appeal 2009-014693 Application 10/921,604 Technology Center 1700 ____________ Decided: April 26, 2010 ____________ Before MICHAEL P. COLAIANNI, JEFFREY T. SMITH, and BEVERLY A. FRANKLIN, Administrative Patent Judges. FRANKLIN, Administrative Patent Judge. DECISION ON APPEAL Appellants appeal under 35 U.S.C. § 134 from the Examiner's rejection of claims 2-12. We have jurisdiction under 35 U.S.C. § 6(b). Appeal 2009-014693 Application 10/921,604 2 STATEMENT OF THE CASE Claim 2 is representative of the subject matter on appeal and is set forth below: 2. A method for controlling the temperature of a substrate in an atomic layer deposition (ALD) process chamber comprising: retaining a substrate on an electrostatic chuck assembly by electrostatic attraction, said substrate, when retained by said chuck assembly, forming a backside gas volume bounded by a backside surface of said substrate, a surface of the chuck assembly, and an annular seal; providing a single backside gas inlet into the electrostatic chuck assembly connected to a backside gas source; providing a backside gas by a first gas outlet arrangement leading to the backside gas volume for supplying said backside gas under pressure to said backside gas volume, said backside gas providing a heat transfer medium between said chuck assembly and said backside surface of said substrate, the first gas outlet arrangement receiving gas from the single backside gas inlet; and creating a pressure gradient across an edge of said substrate by a second gas outlet arrangement, coupled to the backside gas source, to prevent reactive gases from causing deposition on a backside surface of said substrate or deposition on a surface of said chuck assembly, the second gas outlet arrangement comprising a first plurality of gas openings arranged in a ring surrounding the first gas outlet arrangement and surrounding the backside gas volume outside of the annular seal, the second gas outlet arrangement receiving gas from the single backside gas inlet, said step of creating a pressure gradient across an edge of said substrate comprising outputting a gas from said first plurality of gas openings to create a Appeal 2009-014693 Application 10/921,604 3 pressure gradient along an edge of said substrate to reduce the partial pressure of reactive gases along said edge. The prior art relied upon by the Examiner in rejecting the claims on appeal is: Mountsier 5,810,933 Sep. 22. 1998 McMillin 5,835,334 Nov. 10, 1998 Blalock 6,056,850 May 2, 2000 Tsai 6,186,092 B1 Feb. 13, 2001 Tsuruta 2003/0095370 A1 May 22, 2003 THE REJECTION(S)1 1. Claims 2-12 are rejected under 35 USC § 112, first paragraph, as failing to comply with the written description requirement (the Examiner deems the amendment to Claim 2, in a December 4, 2007 response, as new matter not supported by the Specification). 2. Claims 2-4 and 10-12 are rejected under 35 USC § 103(a) as being obvious over Mountsier in view of Tsai. 3. Claims 5, 7, 8 and 10 are rejected under 35 U.S.C. 103(a) as being unpatentable over Mountsier in view of Tsai in view of McMillin. 1 It is recognized that Appellants have not presented separate arguments for rejections 3, 4, and 5, reproduced below. However, since Appellants contend that the combination of Mountsier and Tsai fails to render the subject matter of independent claim 2 unpatentable, this reasoning would also apply to the separately rejected dependent claims. Appeal 2009-014693 Application 10/921,604 4 4. Claim 6 is rejected under 35 U.S.C. § 103(a) as being unpatentable over Mountsier in view of Tsai and McMillin as applied to claims 5, 7, 8 and 10 and further in view of Blalock. 5. Claims 7 and 9 are rejected under 35 U.S.C. § 103(a) as being unpatentable over Mountsier in view of Tsai and McMillin as applied to claims 5, 7, 8 and 10 and further in view of Tsuruta. ISSUE 1. Has the Examiner erred in determining the aspect of claim 2 pertaining to the concept that the second gas outlet arrangement 347 receives gas from a single backside gas inlet 54/312 is not supported by the Specification? We answer this question in the affirmative. 2. Has the Examiner erred in determining that the combination of Mountsier in view of Tsai teaches the aspect of claim 2 wherein both the first gas outlet arrangement 346 and the second gas outlet arrangement 347 receive gas for a single backside gas inlet 54/312? We answer this question in the affirmative. FINDINGS OF FACT The Examiner does not point to any disclosure showing another gas source/line entering ESC 6. The Examiner does not explain how the second gas outlet arrangement 347 receives gas from a source other than the single backside gas inlet 54/312. See Answer generally. Appeal 2009-014693 Application 10/921,604 5 The Examiner does not dispute the findings made by Appellants on pages 10-11 of the Brief regarding certain teachings of Mountsier and Tsai. See Answer generally, and specifically on pages 9-10. The Examiner does not address Appellants’ position that the functionality of the deposition chamber of Mountsier or Tsai would be destroyed according to the proposal made by the Examiner in his statement of the rejection. See Answer generally PRINCIPLES OF LAW The test for determining compliance with the written description requirement is whether the disclosure of the application as originally filed reasonably conveys to the artisan that the inventor had possession at that time of the later claimed subject matter, rather than the presence or absence of literal support in the specification for the claim language. The content of the drawings may also be considered in determining compliance with the written description requirement. In re Kaslow, 707 F.2d 1366, 1375 (Fed. Cir. 1983). If the proposed modification would render the prior art invention being modified unsatisfactory for its intended purpose, then there is no suggestion or motivation to make the proposed modification. In re Gordon, 733 F.2d 900, 902 (Fed. Cir. 1984). “[R]ejections on obviousness cannot be sustained by mere conclusory statements; instead, there must be some articulated reasoning with some rational underpinning to support the legal conclusion of obviousness.’” KSR Int’l. Co. v. Teleflex Co., 550 U.S. 398, 418 (2007), quoting In re Kahn, 441 F.3d 977, 988 (Fed. Cir. 2006). Appeal 2009-014693 Application 10/921,604 6 ANALYSIS 1. The 35 USC § 112, first paragraph (written description) rejection The Examiner does not point to any disclosure showing another gas source/line entering ESC 6. The Examiner does not explain how the second gas outlet arrangement 347 receives gas from a source other than the single backside gas inlet 54/312. See Answer generally. As such, we agree with Appellants that page 35, lines 20-28 of the Specification and Figures 28 and 30 convey to the artisan that all the orifices in the ESC 6 are connected to one gas source 52 and that both Figures 28 and 30 identify the same gas line 54 into the ESC 6. Br. 6-8. Kaslow, 707 F.2d at 1375. We therefore reverse the Examiner’s rejection. 2. The 35 USC § 103 as being obvious over Mountsier in view of Tsai On pages 10-11 of the Brief, Appellants state: Even if the Mountsier and Tsai gas channels were used in a single substrate support assembly and used the same gas (e.g., argon), the gas channels would be connected to independent gas input ports due to the very different functions of the backside gas and purge gas and the different pressure requirements of the backside and purge gases. The pressure of Mountsier's backside gas is carefully varied during a deposition to set the heat transfer coefficient required for the deposition process (see Mountsier Abstract). However, the Tsai purge gas pressure must be a constant optimal pressure to prevent process gases from depositing on the back edges of the substrate while such constant pressure is taken into account when controlling the total gas extraction flow from the process chamber (the combined gases are the process gases and inert purge gas). In Tsai, the process gas flow into and out of the CVD chamber Appeal 2009-014693 Application 10/921,604 7 determines the process gas partial pressure in the chamber and thus the deposition rate on the substrate. So if the purge gas pressure during a reaction increased, the process gas pressure in the chamber would build up and the deposition rate would go up since the exhaust gas flow remains constant. This is unacceptable [sic unexceptable], so the Tsai purge gas flow rate must be fixed. In contrast, the Mountsier backside gas flow must vary to precisely control the substrate temperature. Therefore, the variable Mountsier backside gas and the Tsai purge gas would not be applied through the same inlet into the substrate support, even if the gases were both argon, since the flows of the two gases must be separately controlled in a CVD chamber for proper operation. Tying the two gas outlets together would destroy the functionality of the Mountsier or Tsai deposition chamber (by preventing control of the deposition on the wafer) and could not be suggested. The Examiner does not dispute the findings by Appellants regarding the above-discussed teachings of Mountsier and Tsai. See Answer generally, and specifically on pages 9-10. Moreover, the Examiner does not address Appellants’ position that the functionality of the deposition chamber of Mountsier or Tsai would be destroyed according to the proposal made by the Examiner in his statement of the rejection. As such, we agree with the Appellants’ position. Gordon, 733 F.2d at 901-902 (Fed. Cir. 1984). We also note that the Examiner inadequately responds to Appellants’ position by stating that “one of ordinary skill in the art would know that connecting the outlets to a common source of inert gas (say at the gas bottle or at upstream of pressure controllers in Mountsier [)] would have no problem”. KSR, 550 U.S. at 418, quoting In re Kahn, 441 F.3d 977, 988 (Fed. Cir. 2006). In view of the above, we reverse the rejection. Appeal 2009-014693 Application 10/921,604 8 CONCLUSIONS OF LAW 1. The Examiner erred in determining the aspect of claim 2 pertaining to the concept that the second gas outlet arrangement 347 receives gas for a single backside gas inlet 54/312 is not supported by the Specification. 2. The Examiner erred in determining that the combination of Mountsier in view of Tsai teaches the aspect of claim 2 wherein both the first gas outlet arrangement 346 and the second gas outlet arrangement 347 receive gas from a single backside gas inlet 54/312. DECISION 1. The rejection of claims 2-12 under 35 USC § 112, first paragraph, as failing to comply with the written description requirement is reversed. 2. The rejection of claims 2-4 and 10-12 under 35 USC § 103 as being obvious over Mountsier in view of Tsai is reversed. 3. The rejection of claims 5, 7, 8 and 10 under 35 U.S.C. § 103(a) as being unpatentable over Mountsier in view of Tsai in view of McMillin is reversed. 4. The rejection of claim 6 under 35 U.S.C. § 103(a) as being unpatentable over Mountsier in view of Tsai and McMillin as applied to claims 5, 7-8 and 10 and further in view of Blalock is reversed. Appeal 2009-014693 Application 10/921,604 9 5. The rejection of claims 7 and 9 under 35 U.S.C. § 103(a) as being unpatentable over Mountsier in view of Tsai and McMillin as applied to claims 5, 7, 8 and 10 and further in view of Tsuruta is reversed. REVERSED kmm PATENT LAW GROUP LLP 2635 NORTH FIRST STREET SUITE 223 SAN JOSE, CA 95134 Copy with citationCopy as parenthetical citation