Ex Parte Acar et alDownload PDFPatent Trial and Appeal BoardMar 27, 201813600460 (P.T.A.B. Mar. 27, 2018) Copy Citation UNITED STA TES p A TENT AND TRADEMARK OFFICE APPLICATION NO. FILING DATE 13/600,460 08/31/2012 31817 7590 03/29/2018 SCHWABE, WILLIAMSON & WYATT, P.C. 1211SW5th Avenue, Suite 1600 Portland, OR 97204 FIRST NAMED INVENTOR ErkanAcar UNITED STATES DEPARTMENT OF COMMERCE United States Patent and Trademark Office Address: COMMISSIONER FOR PATENTS P.O. Box 1450 Alexandria, Virginia 22313-1450 www .uspto.gov ATTORNEY DOCKET NO. CONFIRMATION NO. 42P45485 3876 EXAMINER LE,SONT ART UNIT PAPER NUMBER 2868 NOTIFICATION DATE DELIVERY MODE 03/29/2018 ELECTRONIC Please find below and/or attached an Office communication concerning this application or proceeding. The time period for reply, if any, is set in the attached communication. Notice of the Office communication was sent electronically on above-indicated "Notification Date" to the following e-mail address( es): IPDocketing@SCHWABE.com intelparalegal@schwabe.com PTOL-90A (Rev. 04/07) UNITED STATES PATENT AND TRADEMARK OFFICE BEFORE THE PATENT TRIAL AND APPEAL BOARD Ex parte ERKAN ACAR, POOY A TADA YON, ARMEN Y. BALIAN, and ETHAN CAUGHEY Appeal2017-006206 Application 13/600,460 Technology Center 2800 Before ADRIENE LEPIANE HANLON, ROMULO H. DELMENDO, and MONTE T. SQUIRE, Administrative Patent Judges. SQUIRE, Administrative Patent Judge. DECISION ON APPEAL 1 Appellants2 appeal under 35 U.S.C. § 134(a) from the Examiner's final decision to reject claims 1, 4--7, 9, and 12-15, which constitute all the claims pending in this application. We have jurisdiction under 35 U.S.C. § 6(b ). 1 In our Decision, we refer to the Specification filed August 31, 2012 ("Spec."); Final Office Action docketed January 21, 2016 ("Final Act."); Advisory Action docketed March 18, 2016 ("Adv. Act."); Appeal Brief filed November 2, 2016, as corrected November 21, 2016 ("Appeal Br."); Examiner's Answer docketed February 17, 2017 ("Ans."); and Reply Brief filed March 2, 2017 ("Reply Brief'). 2 Appellants identify Intel Corporation as the real party in interest. App. Br. 3. Appeal2017-006206 Application 13/600,460 We REVERSE. The Claimed Invention Appellants' disclosure relates to a test system for electrical testing of integrated circuits before packaging. Spec. i-fi-f l-2. The claimed test system includes a test printed circuit board (PCB), a flip chip package mounted on the PCB, one or more test probes coupled to the flip chip package and a first integrated circuit (IC) coupled to the test probes to enable testing of the first IC using electrical circuitry of the flip chip package. Abstract. Claim 1 is illustrative of the claimed subject matter on appeal and is reproduced below from the Claims Appendix to the Appeal Brief, as amended November 21, 2016 (key disputed claim language italicized and bolded): 1. A test system comprising: a test printed circuit board (PCB); and a multi-chip package mounted on the test PCB, compnsmg: a flip chip package; one or more test probes having a first end coupled to the flip chip package; a central processing unit (CPU) integrated circuit (IC) coupled to a second end of the test probes to enable testing of the first product IC using electrical circuitry of the flip chip package; and a chipset IC mounted on the flip chip package to communicate with the CPU IC during testing of the CPU IC via routing between the CPU IC and the chipset IC. 2 Appeal2017-006206 Application 13/600,460 The References The Examiner relies on the following prior art references as evidence in rejecting the claims on appeal: Sugita et al., US 2005/0099199 Al May 12, 2005 (hereinafter "Sugita") Mooyman-Beck et al., US 2011/0148456 Al June 23, 2011 (hereinafter "Mooyman-Beck") The Rejection On appeal, the Examiner maintains (Ans. 2) the following rejection3,4 : Claims 1, 4--7, 9, and 12-15 are rejected under pre-AIA 35 U.S.C. § 103(a) as being unpatentable over Mooyman-Beck in view of Sugita. Adv. Act. 2-8. 3 The Examiner's rejection of claims 1, 4--7, 9, and 12-15 under 35 U.S.C. § 102(b) as being anticipated by Mooyman-Beck (Final Act. 4) has been withdrawn by the Examiner in the Advisory Action (Adv. Act. 2) as a result of Appellants' March 1, 2016 amendments to the claims being entered. Ans. 3. In the Advisory Action (Adv. Act. 2-8), the Examiner entered a new ground of rejection of claims 1, 4--7, 9, and 12-15 under 35 U.S.C. § 103(a) as being unpatentable over the combination of Mooyman-Beck and Sugita. See Ans. 2. 4 The Examiner's rejection of claims 8 and 16 under 35 U.S.C. § 103(a) as being unpatentable over the combination of Mooyman-Beck and Miller et al. (US 2008/0100320 Al; publ. May 1, 2008) (Final Act. 9) is rendered moot as a result of claims 8 and 16 being cancelled in connection with Appellants' March 1, 2016 amendments to the claims. Appeal Br. 10 (acknowledging that the Examiner's rejection regarding claims 8 and 6 is "obviated by the cancellation of the claims"). 3 Appeal2017-006206 Application 13/600,460 OPINION The Examiner determines that the combination of Mooyman-Beck and Sugita suggests a testing system satisfying all of the limitations of claim 1 and thus, concludes that the combination would have rendered the claim obvious. Adv. Act. 2-5 (citing Mooyman-Beck, Fig. 9, i-fi-134--36; Sugita, Fig. 1, i-fi-f 13, 37--46); Ans. 4--5. Regarding the "chipset IC mounted on a flip chip package" recitation of claim 1, the Examiner relies on element 62 of Figure 9 of Mooyman-Beck for disclosing this limitation. Ans. 4. In particular, the Examiner finds that because Mooyman-Beck discloses that instrument controller 51 and measurement instrument 50 are to be embedded in silicon substrate 62, substrate 62 is an "IC" and the components form a "chipset" in the substrate. Id. at 4--5; see also Adv. Act. 3--4 (interpreting substrate 62 to be an "integrated chip"). Appellants argue that the Examiner's rejection should be reversed because "there is no disclosure in Mooyman-Beck of a multi-chip package including a CPU integrated circuit (IC) and a chipset IC mounted on a flip chip package." App. Br. 7. See also Reply Br. 4 (arguing that the Examiner has "failed to show where in Mooyman-Beck the flip chip package is disclosed with a mounted CPU IC and chipset IC"). In particular, Appellants contend that Mooyman-Beck does not disclose or suggest a chipset IC mounted on a flip chip package because "a controller embedded within a silicon substrate does not constitute a chipset IC," as required by the claim. App. Br. 7. We agree with Appellants' argument in this regard. On the record before us, we are not persuaded that a preponderance of the evidence 4 Appeal2017-006206 Application 13/600,460 supports the Examiner's finding that Figure 9 of Mooyman-Beck discloses or suggests "a chipset IC mounted on the flip chip package," as recited in the claim 1. Mooyman-Beck discloses a method and device for measuring a signal of a die to be placed within a package comprising, among other components, a first interposer 60 and a second interposer 62. Mooyman-Beck i-fi-f l, 8, 34. Mooyman-Beck further discloses that the second interposer 62 is a "silicon- carrier substrate" having signal paths 64 at predetermined positions, and that the signal paths 64 may comprise TSVs (Through-Silicon Vias). Id. i134. Although Mooyman-Beck discloses that measurement instruments 50 and instrument controller 51 are embedded in silicon substrate 62 (Mooyman- Beck i134, Figure 9), there is no teaching or suggestion that the silicon substrate is or would have been construed by one of ordinary skill in the art as being a "chipset IC mounted on the flip chip package," as required by the claim. The Examiner does not direct us to sufficient evidence in the record that Mooyman-Beck's silicon substrate 62 with such embedded components would constitute or necessarily function as a chipset IC, as recited in the claim. The Examiner also does not provide an adequate technical explanation explaining why one of ordinary skill would have had reason to modify the silicon substrate 62 to serve or operate as a chipset IC in the manner claimed. See KSR Int'! Co. v. Teleflex Inc., 550 U.S. 398, 418 (2007) (requiring "reasoning with some rational underpinning to support the legal conclusion of obviousness") (quoting In re Kahn, 441 F .3d 977, 988 (Fed. Cir. 2006)). The fact that Mooyman-Beck discloses that a controller 5 Appeal2017-006206 Application 13/600,460 and measurement instruments may be embedded in the substrate, without more, is insufficient to sustain the Examiner's rejection. The Examiner's findings regarding the teachings of the Sugita reference at pages 4---6 of the Answer and pages 3-5 of the Advisory Action are not persuasive because Sugita's teachings do not cure the above-noted deficiencies in Mooyman-Beck's disclosure and the Examiner's comments do not adequately address Appellants' principal argument that the cited art does not disclose or suggest the "chipset IC mounted on the flip chip package" limitation of claim 1. Kahn, 441 F.3d at 988 (Fed. Cir. 2006) (holding "rejections ... cannot be sustained by mere conclusory statements"). We, therefore, cannot sustain the Examiner's determination that claim 1 's subject matter would have been obvious to a person having ordinary skill in the art in view of Mooyman-Beck and Sugita. Because claims 4--7 depend from claim 1 and claims 9 and 12-15 recite a "mounting a chipset IC included in the multi-chip package on the flip chip package" limitation similar to the "a chipset IC mounted on the flip chip package" recitation of claim 1, we also cannot sustain the Examiner's rejection of these claims. Accordingly, we reverse the Examiner's rejection of claims 1, 4--7, 9, and 12-15 under 35 U.S.C. § 103(a) as being as being unpatentable over the combination of Mooyman-Beck and Sugita. 6 Appeal2017-006206 Application 13/600,460 DECISION/ORDER The Examiner's rejection of claims 1, 4--7, 9, and 12-15 is reversed. It is ordered that the Examiner's decision is reversed. AFFIRMED 7 Copy with citationCopy as parenthetical citation