Medical College of Georgia, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes

This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Suite 4100W, Franklin Court Building, U.S. Department of Commerce, 1099 14th Street, NW., Washington, DC.

Docket Number: 03-031.

Applicant: Medical College of Georgia, Augusta, GA 30912-2630.

Instrument: Electron Microscope, Model JEM-1230 (HC).

Manufacturer: JEOL Ltd., Japan.

Intended Use: See notice at 68 FR 42007, July 16, 2003.

Order Date: April 30, 2003.

Docket Number: 03-032.

Applicant: University of California, Los Angeles, Los Angeles, CA 90095-1763.

Instrument: Electron Microscope, Model Tecnai G² 12 TWIN.

Manufacturer: FEI Company, The Netherlands.

Intended Use: See notice at 68 FR 42007, July 16, 2003.

Order Date: May 29, 2003.

Docket Number: 03-033.

Applicant: University of Washington, Seattle, WA.

Instrument: Electron Microscope, Model Tecnai G² F20 S-TWIN MAT.

Manufacturer: FEI Company, The Netherlands.

Intended Use: See notice at 68 FR 42007, July 16, 2003.

Order Date: May 20, 2003.

Comments: None received.

Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered.

Reasons: Each foreign instrument is a conventional transmission electron microscope (CTEM) and is intended for research or scientific educational uses requiring a CTEM. We know of no CTEM, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument.