Brandeis University, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope

This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Avenue, NW., Washington, DC.

Docket Number: 11-042. Applicant: Brandeis University, Waltham, MA 02454. Instrument: Technai G2 F20 Twin Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 76 FR 48803, August 9, 2011.

Docket Number: 11-043. Applicant: Mississippi State University, Pearl, MS 39208. Instrument: Transmission Electron Microscope. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 76 FR 47148, August 4, 2011.

Docket Number: 11-049. Applicant: University of Missouri, Columbia, MO 65211. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 76 FR 48803, August 9, 2011.

Docket Number: 11-051. Applicant: DOD Uniformed Services University of the Health Sciences, Bethesda, MD 20814-4799. Instrument: Transmission Electron Microscope. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 76 FR 48803, August 9, 2011.

Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as this instrument is intended to be used, is being manufactured in the United States at the time the instrument was ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument.